A current-mode image sensor architecture using a linear-logarithmic pixel in order to improve the dynamic range is presented. The pixel cell is based on a 3T active pixel structure with a PMOS readout transistor in the linear region of operation and a PMOS reset transistor that allows for a linear-logarithmic response. An intrascene dynamic range of 90dB is obtained with a pixel fill factor of 37%. The readout circuit is composed of a first-generation current conveyor, a current memory employed as a delta reset sampling unit, a differential amplifier used as an integrator and a dynamic comparator. The pixel response operating mode is determined in the column readout. A signal is sent to the digital processing unit as an indicator to determine the pixel response operating mode in order to allow the proper analog to digital conversion. The image lag effect observed in the pixel output current is removed by the delta reset sampling circuit. Experimental results, obtained from a test structure, are presented. The circuit was fabricated in a CMOS 0.35um process from Austria Microsystems.
Published in | Science Journal of Circuits, Systems and Signal Processing (Volume 2, Issue 1) |
DOI | 10.11648/j.cssp.20130201.13 |
Page(s) | 16-21 |
Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
Copyright |
Copyright © The Author(s), 2013. Published by Science Publishing Group |
Active Pixel Sensor (APS), Combined Linear-Logarithmic Response, Delta Reset Sampling (DRS), Current Comparator (CMP)
[1] | S. K. Mendis, S. E. Kemeny, R. C. Gee, B. pain, C. O. Staller, Q. Kim, and E. R. Fossum, "CMOS active pixel image sensors for highly integrated imaging systems," IEEE Journal of Solid-State Circuits, vol. 32(2), Feb. 1997, pp. 187–197. |
[2] | F. Hashemi, K.H. Hadidi and A. Khoei, "Design of a CMOS image sensor with pixel-level ADC in 0.35μm process", In-ternational Symposium on Circuits and Systems, 2003, Volume: 2, May 25-28, 2003, Page(s): 600 -603. |
[3] | E. R. Fossum, "CMOS image sensors: Electronic cam-era-on-a-chip," IEEE Transactions on Electron Devices, vol. 44(10), Oct. 1997, pp. 1689–1698. |
[4] | M. Schanz, C. Nitta, A. Bubmann, B. J. Hosticka, and R. K. Wertheimer, "A high dynamic-range CMOS image sensor for automotive applications," IEEE Journal of Solid-State Circuits, vol. 35(7), July 2000, pp. 932–938. |
[5] | M. Schwarz, R. Hauschild, B. J. Hosticka, J. Huppertz, T. Kneip, S. Kolnsberg, L. Ewe, and H. K. Trieu, "Single-chip CMOS image sensors for a retina implant system," IEEE Transactions on Circuits and Systems–II: Analog and Digital Signal Processing, vol. 46(7), July 1999, pp. 870–877. |
[6] | T. Delbruck and C. A. Mead, "Adaptive photoreceptor with wide dynamic range," in Proceeding of 1994 IEEE Interna-tional symposium on circuits and Systems (ISCAS’94), (London, UK), vol. 4, May 30–June 2 1994, pp. 339–342. |
[7] | J. Nakamura, B. Pain, T. Nomoto, T. Nakamura, and E. R. Fossum, "On-focalplane signal processing for current-mode active pixel sensors," IEEE Transactions on Electron Devices, vol. 44(10), Oct. 1997, pp. 1747–1758. |
[8] | L. G. McIlrath, V. S. Clark, P. K. Duane, R. D. McGrath, and W. D. Waskurak, "Design and analysis of a 512×768 cur-rent-mediated active pixel array image sensor,"IEEE Trans-actions on Electron Devices, vol. 44(10), Oct. 1997, pp. 1706–1715. |
[9] | El Gamal A. et eltoukhy H., "CMOS image sensors," IEEE Circuits and Devices Magazine, vol. 21, no. 3, 2005, pp. 6-20. |
[10] | A. Hamasaki, M. Terauchi and K. Horii, "Novel Operation Scheme for realizing Combined Linear-Logarithmic Response in Photodiode-Type Active Pixel Sensor Cells," Japanese J. of Applied Physics, vol. 45, No. 4B, 2006, pp. 3326-3329. |
[11] | R. M. Philipp, D. Orr, V. Gruev, J. Spiegel and R. Etienne-Cummings, "Linear Current-Mode Active Pixel Sensor" IEEE J. Solide-State Circuits, vol. 42, Nov. 2007, pp. 2482-2491. |
[12] | V. Gruev, R. E. Cumming and T. Horiuchi, "Linear Current Mode Imager with Low Fix Pattern Noise", IEEE , 2004. |
[13] | M. Vatteroni, D. Covi and A. Satori, "A Linear-Lorarithmic CMOS pixel for high dynamic range behavior with fixed-pattern noise correction and tunable responsivity", IEEE Sensors Conference, 2008, pp. 930-933. |
[14] | Chris Toumazou, Nick Battersby, Sonia Porta, "Circuits and Systems Tutorials" Ch. 10.1, IEEE Press, ; Institute of Elec-trical and Electronics Engineers, Inc., c1996. |
[15] | Khamsehashari, E. Audet, Y. Fayomi, C., " Digital Linearity Correction of A Wide Dynamic Range Current-Mode Image Sensor," NEWCAS, IEEE International, Oct. 2010, pp. 133-136. |
[16] | Khamsehashari, E., Audet, Y., "Mode detection of a li-near-logarithmic current-mode image sensor," NEWCAS, IEEE International, Aug. 2011, pp. 538-541. |
[17] | Loukianova, N.V. ; Folkerts, H.O. ; Maas, J.P.V. ; Natalia V. Loukianova, Hein Otto Folkerts, Joris P. V. Maas, Daniël W. E. Verbugt, Adri J. Mierop, Willem Hoekstra, "Leakage current modeling of test structures for characterization of dark current in CMOS image sensors," IEEE Transactions on Electron Devices, vol. 50, no. 1, Jan. 2003, pp. 77-83. |
[18] | J. Hughes and K. Moulding, "S I: The seamless S I switch-ed-current cell," in Proc. IEEE ISCAS, HongKong, vol. 1, Jun. 1997, pp. 113–116. |
[19] | Paul R. Gray Paul J. Hurst Stephen H. Lewis Robert G. Meyer, "Analysis and Design of Analog Integrated Circuits (4th Edition)," John Wiley & Sons, Inc., ch.12, 2001. |
[20] | Figueiredo, P.M. (Chipidea Microelectron.,, Porto Salvo, Portugal); Vital, J.C. " Low kickback noise techniques for CMOS latched comparators" IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512), p I-537-40 Vol.1, 2004]. |
[21] | HeungJun Jeon and Yong-Bin Kim, "A Low-offset High-speed Doubletail Dual-rail Dynamic Latched Compa-rator", GLSVLSI’10, May 16–18, 2010, Providence, Rhode Island, USA. |
[22] | Hsiu-Yu Cheng; Choubey, B.; Collins, S., "A High-Dynamic-Range Integrating Pixel With an Adaptive Logarithmic Response," Photonics Technology Letters, IEEE, vol. 19, no. 15, July 2007, pp. 1169-1171. |
[23] | Cheng, Hsiu-Yu; Choubey, Bhaskar; Collins, Steve, "A Wide Dynamic Range CMOS Image Sensor with an Adjustable Logarithmic Response," Proceedings of the SPIE, vol. 6816, 2008, pp. 681602-681602-8. |
[24] | Liang-Wei Lai Cheng-Hsiao Lai Ya-Chin King, "A Novel Logarithmic Response CMOS Image Sensor with High Output Voltage Swing and In-Pixel Fixed-Pattern Noise Reduction," Sensors Journal, IEEE , vol. 4, no. 1, Jan. 2004, pp. 122-126. |
[25] | Kavadias, S. Dierickx, B. Scheffer, D. Alaerts, A. , "A Logarithmic Response CMOS Image Sensor with On-Chip Calibration," Solid-State Circuits, IEEE Journal, vol. 35, no. 8, Aug. 2002, pp. 1146-1152. |
[26] | Ide, N., Woonghee Lee, Akahane, N., Sugawa, S., "A Wide DR and Linear Response CMOS Image Sensor with Three Photocurrent Integrations in Photodiodes, Lateral Overflow Capacitors and Column Capacitors," : Solid State Circuits Conference, ESSCIRC 2007. 33rd European, Jan. 2008, pp. 336-339. |
[27] | Zheng Yang Gruev, V. Van der Spiegel, J., " Current-Mode Image Sensor with 1.5 Transistors per Pixel and Improved Dynamic Range," ISCAS IEEE International Symposium, May 2008, pp. 1850-1853. |
APA Style
Elham Khamsehashari, Yves Audet. (2013). Response Mode Detection of a Linear-Logarithmic Image Sensor Using a Current-Mode Readout Circuit. Science Journal of Circuits, Systems and Signal Processing, 2(1), 16-21. https://doi.org/10.11648/j.cssp.20130201.13
ACS Style
Elham Khamsehashari; Yves Audet. Response Mode Detection of a Linear-Logarithmic Image Sensor Using a Current-Mode Readout Circuit. Sci. J. Circuits Syst. Signal Process. 2013, 2(1), 16-21. doi: 10.11648/j.cssp.20130201.13
AMA Style
Elham Khamsehashari, Yves Audet. Response Mode Detection of a Linear-Logarithmic Image Sensor Using a Current-Mode Readout Circuit. Sci J Circuits Syst Signal Process. 2013;2(1):16-21. doi: 10.11648/j.cssp.20130201.13
@article{10.11648/j.cssp.20130201.13, author = {Elham Khamsehashari and Yves Audet}, title = {Response Mode Detection of a Linear-Logarithmic Image Sensor Using a Current-Mode Readout Circuit}, journal = {Science Journal of Circuits, Systems and Signal Processing}, volume = {2}, number = {1}, pages = {16-21}, doi = {10.11648/j.cssp.20130201.13}, url = {https://doi.org/10.11648/j.cssp.20130201.13}, eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.cssp.20130201.13}, abstract = {A current-mode image sensor architecture using a linear-logarithmic pixel in order to improve the dynamic range is presented. The pixel cell is based on a 3T active pixel structure with a PMOS readout transistor in the linear region of operation and a PMOS reset transistor that allows for a linear-logarithmic response. An intrascene dynamic range of 90dB is obtained with a pixel fill factor of 37%. The readout circuit is composed of a first-generation current conveyor, a current memory employed as a delta reset sampling unit, a differential amplifier used as an integrator and a dynamic comparator. The pixel response operating mode is determined in the column readout. A signal is sent to the digital processing unit as an indicator to determine the pixel response operating mode in order to allow the proper analog to digital conversion. The image lag effect observed in the pixel output current is removed by the delta reset sampling circuit. Experimental results, obtained from a test structure, are presented. The circuit was fabricated in a CMOS 0.35um process from Austria Microsystems.}, year = {2013} }
TY - JOUR T1 - Response Mode Detection of a Linear-Logarithmic Image Sensor Using a Current-Mode Readout Circuit AU - Elham Khamsehashari AU - Yves Audet Y1 - 2013/02/20 PY - 2013 N1 - https://doi.org/10.11648/j.cssp.20130201.13 DO - 10.11648/j.cssp.20130201.13 T2 - Science Journal of Circuits, Systems and Signal Processing JF - Science Journal of Circuits, Systems and Signal Processing JO - Science Journal of Circuits, Systems and Signal Processing SP - 16 EP - 21 PB - Science Publishing Group SN - 2326-9073 UR - https://doi.org/10.11648/j.cssp.20130201.13 AB - A current-mode image sensor architecture using a linear-logarithmic pixel in order to improve the dynamic range is presented. The pixel cell is based on a 3T active pixel structure with a PMOS readout transistor in the linear region of operation and a PMOS reset transistor that allows for a linear-logarithmic response. An intrascene dynamic range of 90dB is obtained with a pixel fill factor of 37%. The readout circuit is composed of a first-generation current conveyor, a current memory employed as a delta reset sampling unit, a differential amplifier used as an integrator and a dynamic comparator. The pixel response operating mode is determined in the column readout. A signal is sent to the digital processing unit as an indicator to determine the pixel response operating mode in order to allow the proper analog to digital conversion. The image lag effect observed in the pixel output current is removed by the delta reset sampling circuit. Experimental results, obtained from a test structure, are presented. The circuit was fabricated in a CMOS 0.35um process from Austria Microsystems. VL - 2 IS - 1 ER -